Expect data signals are generated for a series of applied data signals having a known sequence to determine if groups of the applied data signals were properly captured. A first group of the applied data signals is captured, and a group of expect data signals are generated from the first group. A second group of the applied data signals is then captured and determined to have been properly captured when the second group corresponds to the group of expect data signals. In this way, when a captured series of data signals is shifted in time from an expected capture point, subsequent captured data signals are compared to their correct expected data signals to determine whether the group, although shifted in time, was nonetheless correctly captured. Expect data signals are generated in this manner and may be utilized in a variety of integrated circuits, such as an SLDRAM.