A management system for managing information of monitor wafers stored in a
storage center includes an operation rule module for determining the next
manufacturing process for each of the monitor wafers according to its
wafer number and wafer condition, an information update module for
updating the information of the monitor wafers in a database according to
the results made by the operation rule module, an inventory module for
computing an inventory quantity of the monitor wafers according to the
wafer numbers and the wafer conditions of the monitor wafers, a warning
module for checking whether the inventory quantity of the monitor wafers
is less than the quantity of the safety stock or not and sending a warning
message when the inventory quantity of the monitor wafers is less than the
quantity of the safety stock, and a display module for showing the wafer
conditions and the inventory quantity of the monitor wafers.
