Photosensitive polymers, resist compositions comprising the same, and methods for forming photoresistive patterns

   
   

A resist composition includes a photoacid generator (PAG) and a photosensitive polymer. The photosensitive polymer includes a comonomer having an acid-labile substituent group or a polar functional group, and a copolymer of alkyl vinyl ether and maleic anhydride. The copolymer is represented by the following structure: ##STR1## where k is an integer of 3 to 8, and where X is tertiary cyclic alcohol having 7 to 20 carbon atoms.

Una composición del resistir incluye un generador del photoacid (PAG) y un polímero fotosensible. El polímero fotosensible incluye un comonomer que tiene un grupo a'cido-acid-labile del sustituto o un grupo funcional polar, y un copolímero del éter alkyl del vinilo y del anhídrido maleic. El copolímero es representado por la estructura siguiente: ## del ## STR1 donde está un número entero k de 3 a 8, y donde está alcohol X cíclico terciario que tiene 7 a 20 átomos de carbón.

 
Web www.patentalert.com

< Photoresist monomers, polymers thereof and photoresist compositions containing the same

< Polymers and photoresist compositions comprising same

> Copolymers and photoresist compositions comprising same

> Photosensitive polymer containing silicon and a resist composition using the same

~ 00158