A system and method for making efficient use of fuse ROM redundancy to increase yield and security. Some embodiments provide a memory repair system including a non-volatile memory component and a controller coupled to the non-volatile memory component. The non-volatile memory component includes a plurality of memory locations. The plurality of memory locations includes a replacement memory location to replace a faulty memory location and a replacement indicia memory location to store replacement memory location indicia. The controller coupled to the non-volatile memory component reads replacement memory location indicia from the replacement indicia memory location, determines an address for the replacement memory location using the indicia, reads the replacement memory location, and transfers a data value contained in the replacement memory location to a second memory component to repair a defective memory location of the second memory component.