A computer tomography apparatus (100) for examination of an object of interest (107), the computer tomography apparatus (100) comprising detecting elements (123) adapted to detect electromagnetic radiation coherently scattered from an object of interest (107) in an energy-resolving manner, and a determination unit (118) adapted to determine structural information concerning the object of interest (107) based on a statistical analysis of detecting signals received from the detecting elements (123).

 
Web www.patentalert.com

< System and method for normalization and calibration of an imaging system using a variable thickness filter

> X-ray CT apparatus

> Reflective X-ray microscope and inspection system for examining objects with wavelengths <100 nm

~ 00562