A method of measuring a coating thickness involves projecting a pattern of
light on a surface. A first reflection of the pattern of light is
received by a first image capturing device. A second reflection of the
pattern of light is received by an image capturing device which may be
the same or a different image capturing device. The first reflection is
compared with the second reflection. A first dated map of the surface is
created by comparing the first reflection and the second reflection. A
coating is deposited on the surface. A second data map of the surface
with the coating is created by comparing reflections. The first data map
and the second data map are then compared to determine a thickness of the
coating.