An image analysis workstation for analyzing optical thin film arrays is
disclosed. One disclosed embodiment relates to individual arrays that
comprise a single optical thin film test surface that provides a
plurality of discretely addressable locations, each comprising an
immobilized capture reagent for an analyte of interest. These are
referred to herein as "arrayed optical thin film test surfaces."
Preferably, an individual arrayed optical thin film test surface
comprises at least 4, more preferably at least 16, even more preferably
at least 32, still more preferably at least 64, and most preferably 128
or more discretely addressable locations. One or more of the discretely
addressable locations may provide control signals (e.g., for normalizing
signals and/or that act as positive and/or negative controls) or fiducial
signals (i.e., information that is used to determine the relative
alignment of the arrayed optical thin film test surface within the
device.