An apparatus and method is disclosed for providing automated testing for an on-chip initialization counter circuit that comprises a plurality of counter flip-flop circuits that are used in the initialization of an integrated circuit. The apparatus comprises a state machine and a state machine counter circuit. The state machine receives signals from the initialization counter circuit and utilizes the signals to create a built-in self test output signal that indicates a current state within the initialization counter circuit. The state machine is capable of testing various operational states of an initialization counter circuit.