Disclosed herein is an apparatus that relates to a device useful in integrated chip (IC) testing apparatus. More particularly, the device is an adjustable clamp assembly which allows a variety of different sized IC's to be used with a single piece of test equipment. The clamp assembly includes a frame, a base and a plurality of clamps. Each clamp is movably connected to the base to allow movement in the x-y directions and each of the clamps includes an z-direction adjustment mechanism. Additionally, the device according to this invention also includes an adapter having opposed adapters which are designed for compatible mating with a mechanized handlers. In an exemplary embodiment, the adapter has a suspension system designed for quiet mechanized handling of the IC while being held by the clamp assembly.