Alloy memory structures and methods are disclosed wherein a layer or volume of alloy material changes conductivity subsequent to introduction of a electron beam current-induced change in phase of the alloy, the conductivity change being detected using current detection means such as photon-emitting P-N junctions, and being associated with a change in data bit memory state.

 
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> Method for fabricating semiconductor components with thinned substrate, circuit side contacts, conductive vias and backside contacts

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