A testing system or method compares read data from one or more dies in a semiconductor wafer with the original data written onto the one or more dies. The testing system includes one or more write registers connected to one or more dies on the semiconductor wafer. One or more comparators are connected to the dies and the write registers. The comparator generates a result in response to the original data and the read data.

 
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> Precise and permanent modification of the resonant frequency of a dielectric microcavity and correction of frequency shifts in dielectric coupled-resonator filters

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