A system and method to fully characterize the thermal behavior of complex
3D submicron electronic devices. The system replaces and/or supplements
laser-based surface temperature scanning with a CCD camera-based
approach. A CCD camera records multiple points of light energy reflected
from an integrated circuit to obtain a temperature measurement. The
system is used to non-invasively measure with submicron resolution the 2D
surface temperature field of an activated device. The measured 2D
temperature field is used as input for an ultra-fast inverse
computational solver. The system couples measured results and
computations in a novel approach, making it possible to extract geometric
and thermal features of a device, and to obtain critically needed
temperature distributions over the entire 3D volume of that device,
including regions that are physically or optically inaccessible. The
obtained distributions reflect the real, and not merely theoretical,
physical construction and thermal behavior of that device.