A non-destructive technique and related array for writing and reading magnetic memory cells, including sampling a first signal of a selected read line corresponding to select memory cells, applying a magnetic field to the select memory cells, sampling a second signal of the selected read line, and comparing the first and second signals to determine a logic state of the select memory cells.

 
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> Semiconductor memory device layout comprising high impurity well tap areas for supplying well voltages to N wells and P wells

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