Unselected groups of non-volatile storage elements are boosted during programming to reduce or eliminate program disturb for targeted, but unselected memory cells connected to a selected word line. Prior to applying a program voltage to the selected word line and boosting the unselected groups, the unselected groups are pre-charged to further reduce or eliminate program disturb by providing a larger boosted potential for the unselected groups. During pre-charging, one or more pre-charge enable signals are provided at higher voltages for certain memory cells that may have undergone partial programming.

 
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< Erasing non-volatile memory utilizing changing word line conditions to compensate for slower erasing memory cells

> NAND memory array incorporating capacitance boosting of channel regions in unselected memory cells and method for operation of same

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