The present invention is a method for detecting an abnormal event for process units of an ethylene processing system. The method compares the operation of the process units to a model developed by principal components analysis of normal operation for these units. If the difference between the operation of a process unit and the normal operation indicates an abnormal condition, then the cause of the abnormal condition is determined and corrected.

 
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< Cleaning device, process cartridge, and image forming apparatus that include a blade that is pressed against a surface of a rotating member at a surface pressure of 2.0 MPa or more

> Display device and a driver circuit thereof

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