Systems and methods of characterizing eye diagrams are described. In one aspect, at measurement times across a measurement interval spanning at least one unit interval of the input signal, corresponding levels of the input signal are classified into groups based on at least one threshold. An eye diagram characteristic width is derived based on a distribution across the measurement interval of the levels in one of the groups.

 
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< Mass spectrometer and method for enhancing dynamic range

> Apparatus for combined laser focusing and spot imaging for MALDI

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