A data recovery apparatus and method used for a flash memory, which can recover data damaged or lost when power supplied to the flash memory is cut off while data operations are being consecutively performed on at least one data stored in the flash memory. The data recovery apparatus performs a data operation at each of a plurality of consecutive logical addresses, and if the data operations performed at the logical addresses are successful, records a mark value in a last index area of a plurality of consecutive index areas respectively corresponding to the consecutive logical addresses.

 
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> Semi-conductor component test device, in particular data buffer component with semi-conductor component test device, as well as semi-conductor component test procedure

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