A test method allows testing of source-synchronous high-speed wide busses on automatic testing equipment for at-speed characterization and production at-speed testing. An integrated circuit that is verified using the method and systems including such an integrated circuit are also disclosed. The invention can enable sampling or testing of signals or test pins that that are running very fast, particular compared to available automatic testing equipment for testing these device. The invention uses data recovery emulation on various types of automated test equipment to capture output data for further, more sophisticated analysis.