The exposure system comprises a projection optical system that irradiates exposure light emitted from a mask onto a substrate, a first support member that supports the projection optical system, and a support structure that supports the first support member, wherein the support member supports the first support member at a position that is higher than the position at which the first support member supports the projection optical system.

 
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< X-ray irradiator and X-ray imaging apparatus

> Asymmetric flattening filter for x-ray device

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