A quality control system and method are provided for troubleshooting and performance testing of detectors in a Gamma camera that includes a field programmable gate array for forming digital words to be converted to a pulse, a test pattern generator for storing the digital words, a digital analog converter for converting the digital words into an analog voltage, an amplifier for amplifying and applying the analog voltage, and an analog multiplexor for accepting the analog voltage. The Gamma camera comprises a collimator, a scintillation crystal, a light guide, a photomultiplier tube, and an electronic circuit.

 
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> Superresolution in microlithography and fluorescence microscopy

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