Polarimeters based on transversal division of the input beam and use of different polarization elements in different polarization states to change polarizations of different portions of the input beam so that the power levels of the different portions of the input beam can be measured to determine the polarization state of the input beam. A wedged substrate can be used to direct the different portions of the input beam at different directions and a lens can be used to focus these different portions at different locations at a plane.

 
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< Retardance measurement system and method

> Plasmon excitation by the gaussian-like core mode of a photonic crystal waveguide

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