Systems and methods are disclosed herein to provide variable test techniques for RFID devices. For example, in accordance with an embodiment of the present invention, a radio frequency identification (RFID) test system includes an RFID reader adapted to provide an RF signal to an RFID device, wherein a signal level of the RF signal changes as the RFID device moves through a test region. The performance level of the RFID device is determined based upon the number of times the RFID device responds to the RF signal.

 
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