In a method for planning an examination of an examination subject in a
magnetic resonance system, wherein images of different regions of the
examination subject are acquired that are assembled into an overall
image, the position of at least one first image in the examination
subject, the measurement parameters for this at least one MR image are
established, the position of at least one second image in the examination
subject is determined, the measurement parameters for the at least one
second image are established, and the measurement parameters that are
dependent measurement parameters are determined. With these dependent
measurement parameters the measurement parameters in the images are set
(adjusted) such that they are identical for all images.