A method of monitoring machine operation includes sensing an operating characteristic of a plurality of machines and calculating a performance metric. The performance metric is indicative of the operating characteristic of at least a portion of the plurality of machines. The method also includes storing the performance metric and comparing the performance metric to at least one other stored performance metric.

 
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> Substrate for mounting IC chip, substrate for motherboard, device for optical communication, manufacturing method of substrate for mounting IC chip, and manufacturing method of substrate for motherboard

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