An apparatus for transverse characterization of materials includes a lower
pattern of contacts, separated by spacings, a material, and an upper
pattern of a multiplicity of contacts, separated by spacings differing
from the spacings of the lower pattern. The transverse characterization
method includes receiving lower pattern of a multiplicity of contacts,
separated by spacings along a surface, with a material above the surface,
successively placing an upper contact near the upper surface of the
material in an upper pattern of locations separated by spacings differing
from the spacings of the lower pattern, measuring the characteristics
between the upper contact and one or more contacts of the lower pattern
and evaluating the measured characteristics to previous measurements,
wherein the evaluation provides the transverse characterization.