A circuit configuration has a load transistor and a current measuring
configuration. A method ascertains a load current through a load
transistor. The circuit configuration includes a first and a second
current sensor with a current measuring transistor in each case. Each of
the current sensors provide a current measurement signal that is fed to
an evaluation circuit. The evaluation circuit provides, from the first
current measurement signal, a current measurement signal that is
dependent on the load current. The load transistor and the current
measuring transistors are preferably integrated in a common semiconductor
body having a multiplicity of transistor cells of identical construction.
The evaluation circuit preferably accounts for the spatial position of
the cells of the first and second current measuring transistors in the
cell array.