The invention relates to a method for determining the paper quality for halftone printing, according to which a finely distributed pattern of geometric figures is applied to the paper, said paper is then illuminated and the light that is reflected and scattered by the paper is observed. The method is characterized in that the pattern is applied to an optical transparent planar element, the side of said element bearing the pattern is brought into contact with the surface of the paper and the paper is pressed against the planar element.

 
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< Non-contact optical profilometer with orthogonal beams

< SPR interferometer

> Glare-directed imaging

> Metrology system with spectroscopic ellipsometer and photoacoustic measurements

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