Chemically-amplified positive photoresist compositions are provided that contain a resin that comprises acetal and alicyclic groups. Photoresists of the invention can exhibit notably enhanced lithographic properties. Preferred photoresists of the invention comprise one or more photoacid generator compounds and one or more phenolic resins comprise one or more photoacid-labile acetal groups and one or more alicyclic groups such as adamantyl.

 
Web www.patentalert.com

< Radiation-sensitive negative-type resist composition for pattern formation method

< Photoresist compositions

> Photoresist compositions

> Resist composition and pattern forming method using the same

~ 00279