A method and system are disclosed for efficiently and effectively toggling logic states of chip elements during a burn-in process of a digital integrated circuit chip. A set of IDDQ patterns are generated by a design simulation tool, based on the design of the chip, during a simulation of the design. The set of IDDQ patterns are translated to a set of burn-in patterns that are compatible with a pattern format of a burn-in board using a pattern translation tool. The set of burn-in patterns are stored in memory on the burn-in board and shifted into the memory during the burn-in process to aid in toggling logic states of the chip elements.