A semiconductor circuit designing apparatus includes a circuit design unit executing
and an inspection item database section. The circuit design unit executes a logical
design of a semiconductor integrated circuit. In the inspection item database section
a circuit feature of the semiconductor integrated circuit corresponds to an inspection
item of an inspection to be executed before a layout design of the semiconductor
integrated circuit is executed. The circuit design unit generates target circuit
feature information indicating the circuit feature of a target semiconductor integrated
circuit of the semiconductor integrated circuit of which the logical design should
be executed. The circuit design unit obtains a target inspection item of the inspection
item corresponding to the target circuit feature information from the inspection
item database section. The circuit design unit executes the logical design of the
target semiconductor integrated circuit in reference to the target inspection item.