In a signal supply apparatus such as might find use in an electro-optical device, signals that are supplied from multiple digital-to-analog converters are subject to impedance conversion by respective voltage followers, and provided as outputs to control the operation of the device. In the signal supply apparatus in a diagnostic examination mode, switching elements are operated so that output lines of the voltage followers are short-circuited by an output examination line. A current value measured as a result of the short circuit is compared with a specified current value to make a good-or-bad determination for the signal supply apparatus.

 
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