A method for enabling bitwise or bit slice constraints to be provided as part
of
the test generation process, by providing a language structure which enables these
constraints to be expressed in a test generation language such as e code for example.
The language structure for such bitwise constraints is then handled in a more flexible
manner, such that the test generation process does not attempt to rigidly "solve"
the expression containing the constraint as a function. Therefore, the propagation
of constraints in such a structure do not necessarily need to be propagated from
left to right, but instead are generated in a multi-directional manner. The language
structure is particularly suitable for such operators as "[:]", "|", "&", "^",
"", "" and "<<".
