A system and method for measuring optical characteristics of an optical device
under test (DUT) is provided. The system includes a light source for generating
an optical signal applied to the optical DUT. A reference interferometer and a
test interferometer are optically coupled to the light source. A computing unit
is coupled to the interferometers, and utilizes amplitude and phase computing components,
such as orthogonal filters, in determining optical characteristics of the optical DUT.
