A method is described which applies the combination of Electroacoustic and Complex
Conductivity measurements to characterize particle electric surface properties,
such as -potential, and bulk properties, such as the dielectric permittivity,
in systems where conductivity data is required for applying an appropriate theoretical
model for calculating output parameters from the measured data. In particular,
this is important in low conducting systems for which the double layer thickness
exceeds the particle radius or in the systems where particles have either high
bulk dielectric permittivity or high conductivity.
