A bridge circuit disposed between a device under test (DUT) and conventional
automatic
test equipment (ATE) extends the performance of the ATE. The bridge circuit allows
the ATE to test ICs capable of operating at frequencies above the ATE's normal
performance limits. In some embodiments, the bridge circuit also extends ATE functionality,
providing frame alignment and automatic test-vector generation, for example, and
can increase the number of available test channels.
