A non-contacting mensuration system including a light source for projecting light
on a target; an imager having an image plane; a first optical subsystem configured
to project a first image of the light on the target onto a first portion of the
image plane of the imager; and a second optical subsystem configured to project
a second image of the light on the target onto a second portion of the image plane
of the imager so that two different images are obtained from different aspects simultaneously.
