Integration of low .epsilon. thin films and Ta into Cu dual damascene

   
   

New precursors and processes to generate fluorinated poly(para-xylylenes) ("PPX") and their chemically modified films suitable for fabrications of integrated circuits ("ICs") of <0.15 .mu.m are disclosed. The films so prepared have low dielectric constants (".di-elect cons.") and are able to keep the integrity of the dielectric, Cu, and the barrier metal, such as Ta. Hence, the reliability of ICs can be assured.

 
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