An electromagnetic disturbance analysis method for analyzing an external
noise to a semiconductor integrated circuit includes an impedance
extraction step of extracting impedance information on the power wiring in
the target semiconductor integrated circuit or the power wiring in the
semiconductor integrated circuit and the external power wiring of the
semiconductor integrated circuit, an equivalent circuit creating step of
creating an equivalent circuit from the impedance information, and an
analysis step of supplying a noise waveform externally and analyzing the
influence of the noise on the semiconductor integrated circuit.
