An improved smoothing layer for use with a thick film dielectric layer, and improved composite thick film dielectric structure is provided. The smoothing layer is a piezoelectric or ferroelectric material that has a reduced amount of defects. The smoothing layer is formed by the addition of surfactant to a sol gel or metal organic solution of organo metallic precursor compounds. The composite thick film dielectric structure comprises a thick film dielectric composition having a PZT smoothing layer thereon, the smoothing layer being made by a process incorporating surfactant. Both the smoothing layer and the composite thick film dielectric structure are for use in electroluminescent displays.