Systems configured to perform a non-contact method for determining a property of a specimen are provided. One system configured to perform a non-contact method for determining a property of a specimen includes a focused biasing device configured to provide a stimulus to a focused spot on the specimen. The system also includes a sensor configured to measure a parameter of a measurement spot on the specimen. The measurement spot overlaps the focused spot. The system further includes a processor configured to determine the property of the specimen from the parameter.

 
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< Electro-optic device, method for fabricating the same, and electronic apparatus

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> CMOS image sensors having pixel arrays with uniform light sensitivity

> Magnetic write head having a shield that extends below the leading edge of the write pole
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