In some embodiments of the invention, a probing apparatus can comprise a
substrate, a spring structure attached to the substrate, and a plurality
of resilient probes attached to the spring structure. Each probe can
comprise a contact portion disposed to contact a device. The spring
structure can provide a first source of compliance for each of the probes
in response to forces on the contact portions of the probes, and each of
the probes can individually provide second sources of compliance in
response to the forces on the contact portions of the probes.