At least one pair of electrode formed on a mounting surface of a stage is in contact with a conductive layer formed on a first surface of an inspection object, and an electrical path is formed between the both by using a fritting phenomenon.
Web www.patentalert.com
< Ultrasound imaging system
> Wafer-level burn-in and test
> Measuring board for electronic device test apparatus
HOME | NEW USER | LOGIN | SUBSCRIPTIONS | SEARCH | GUESTBOOK | CONTACT