A potential which is applied to a gate electrode of a driving transistor in accordance with an emission state or a non-emission state of a light-emitting element fluctuates due to noise or leakage from a selection transistor, or the like, which causes a problem in that the driving transistor cannot turn on or off normally and malfunctions. The present invention includes a transistor connected to a light-emitting element, a power source line, a scan line, a memory circuit, and a switching circuit, in which the transistor controls light emission or non light emission of the light-emitting element, and the switching circuit controlled by the scan line conducts switching between the transistor, and the memory circuit and the power source line, and applies an input potential to the transistor.