A method and system of identifying overlays. At least some of the illustrative embodiments are methods comprising executing a traced program on a target system (the traced program comprising a plurality of overlay programs), obtaining values indicative of which of the plurality of overlays of the traced program has executed on the target system, and displaying on a display device an indication of a proportion of an execution time on the processor of the target system dedicated to each of the plurality of overlay programs.

 
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< Mechanisms for dynamic configuration of virtual processor resources

> Semiconductor test apparatus for simultaneously testing plurality of semiconductor devices

> Test wrapper including integrated scan chain for testing embedded hard macro in an integrated circuit chip

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