A probe for electrical test provided with positioning marks parallel to a plane where tips are provided and at a height position lower than the plane on a plane directed in the same direction as the plane, the positioning marks are in a predetermined positional relation to said tips. The positioning marks contain information indicating an existing direction of the tips when the positioning marks are observed from the projecting direction of the tips.

 
Web www.patentalert.com

< Probe card assembly with a dielectric strip structure coupled to a side of at least a portion of the probes

> Body for keeping a wafer, heater unit and wafer prober

> Probe card manufacturing method including sensing probe and the probe card, probe card inspection system
~ 00550