Column switches are disposed for sense amplifiers respectively and are
selectively turned on according to a column address to connect the sense
amplifiers to a common data line. A sense amplifier control circuit
activates a sense amplifier activation signal to operate the sense
amplifiers. During a test mode, the sense amplifier control circuit
changes time interval from activation of a word line to the activation of
the sense amplifier activation signal, according to the column address.
Then, a time interval after data is read to a bit line from a test target
memory cell until the corresponding sense amplifier starts an amplifying
operation is made constant irrespective of the position of the memory
cell. Consequently, the same test condition can be set for the memory
cells irrespective of the memory cells' positions. Correct evaluation of
operation margins of the memory cells is possible irrespective of the
positions of memory cells.