A method and apparatus for determining statistical characteristics of nano-particles includes distributing the nano-particles over a surface and then determining properties of the nano-particles by automatic measurement of multiple particles or by a measurement that determines properties of multiple particles at one time, without manipulating individual nano-particles.

 
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> Low voltage flexible organic/transparent transistor for selective gas sensing, photodetecting and CMOS device applications

> Scalable integrated logic and non-volatile memory

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