A method for tracing an instrumented program on a processor having an x86 architecture, including triggering a probe in the instrumented program, obtaining an original instruction associated with the probe, loading the original instruction into a scratch space, loading a jump instruction for the x86 architecture into the scratch space wherein the jump instruction includes a next program counter value, executing the original instruction in the scratch space using a thread, and executing the jump instruction in the scratch space using the thread.

 
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< Random test generation using an optimization solver

> Method and placement tool for designing the layout of an electronic circuit

> Method and system for detecting runtime defects in a program by comparing correct and incorrect runs

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