A method and apparatus for current detection for microelectronic devices using source-switched sensors. An embodiment of a current detector for a microelectronic device includes a first voltage sensor and a second voltage sensor. The first voltage sensor is to measure a first voltage of the microelectronic device during a first time period and a second voltage of the microelectronic device during a second time period. The second voltage sensor is to measure the second voltage during the first time period and the first voltage during the second time period. A voltage value is equal to the sum of the first voltage measured by the first sensor plus the first voltage measured by the second sensor, minus the sum of the second voltage measured by the first sensor plus the second voltage measured by the second sensor. Other embodiments are also described and claimed.