The present invention is directed to an apparatus and a method for monitoring the viscoelastic properties, of a liquid film (e.g. coating). The apparatus includes a substrate for supporting a liquid film and a T-bar probe that is partially submerged in the liquid film. The apparatus is designed to be attached to a conventional rheometer equipped with a means for effecting relative movement between the probe and the substrate and means for monitoring the resistance to movement of the probe in contact or partially submerged in the film to obtain a measurement of the solidification properties of the liquid film. This apparatus and method are particularly useful in comparing the effects of film formers, viscosity modifiers, solvents, and minerals on the drying rate of coatings at the early stage of film formation.

 
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